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力豐制造科技有限公司

(展臺：W3-C104）

LEEPORT TECHNOLOGY LIMITED

(Booth: W3-C104)

研討會地點：

中國國際展覽中心(新館)

綜合服務樓二層東E-207 室

 

Venue:

Room E-207, 2F, East Service Building of China International Exhibition Center (New Venue)

 

研討會題目及簡介

Seminar Topic and Brief Introduction

 

 

Metris（邁卓斯）X-Tek X光斷層檢測技術：展示現今高科技X光斷層于高精度檢測的應用，通過非摧毀性方式對檢測物件進行外部及內部三維檢測。

 

X-ray CT measurement by Metris X-TEK:  To demonstrate how today’s high tech X-ray CT can perform high precision measurement for entire measured parts including external and internal 3D measurement with non-destructive means. 

 

 

 

Metris（邁卓斯）iGPS及激光雷達大型檢測技術：介紹利用GPS概念的新科技如何把整個車間變成數碼空間，而且可以無限擴展。現場講解航空及造船業的應用案例。

 

Large space Measurement by Metris iGPS & Laser Radar: Introducing new technology to turn the whole factory floor into a digitizing space using GPS concept with unlimited expansion.  Case study for aircraft building industry and ship building industry.

 

 

 

Metris（邁卓斯）MCA及MMD掃描器提供的便攜式數碼檢測方案：介紹以防操作疲勞為設計原則的測量臂（配合激光掃描器及接觸式探針）如何輕易進行掃描及檢測以前難于掃描的表面，比如：鏡面及黑色的表面。

 

Portable digitizing solution by Metris MCA & MMD Scanner– Introducing health cautious spin arm with laser scanning and touch trigger probe option, to easily scan/ measure hard to scan surfaces in the past such as mirror, black surfaces.

 

 

 

Metris（邁卓斯）光學便攜式三座標檢測系統：現場演示以光學便攜式三座標檢測系統進行掃描、點對點或者實時動態檢測，協助用戶通過一便攜式系統在生產現場進行產品組裝分析。

 

Optical handheld CMM system by Metris K Series – Introducing optical handheld CMM system to do scanning, point or even real time dynamic measurement for product assembly analysis in one easily portable system around the production site.